INTERNATIONAL ISO/IEC STANDARD 10373-3 Third edition 2018-09 Identification cards Test methods - Part 3: Integrated circuit cards with contacts and related interface devices Cartes d'identification - Méthodes d'essai - Partie 3: Cartes a circuit(s) intégré(s) a contacts et dispositifs d'interface assimilés Reference number IS0/IEC 10373-3:2018(E) EC ISO @ IS0/IEC 2018 IS0/IEC 10373-3:2018(E) COPYRIGHT PROTECTED DOCUMENT IS0/IEC 2018 be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior written permission. Permission can be requested from either Iso at the address below or IsO's member body in the country of the requester. ISO copyright office CP 401 : Ch. de Blandonnet 8 CH-1214 Vernier, Geneva Phone: +41 22.749 01 11 Fax: +41227490947 Email: [email protected] Website: www.iso.org Published in Switzerland ii @ IS0/IEC 2018 - All rights reserved IS0/IEC 10373-3:2018(E) Contents Page Foreword vi 1 Scope 2 Normative references 3 Terms and definitions. .1 4 General items applicable to the test methods 2 4.1 Test environment. 2 4.2 Pre-conditioning. 2 4.3 Selection of test methods 2 4.4 Default tolerance.. 4.5 Total measurement uncertainty 3 4.6 3 Conventions for electrical measurements 4.7 Apparatus. 4.7.1 Apparatus for testing the integrated circuit cards with contacts (card-test- apparatus). 3 4.7.2 Apparatus for testing the interface device (IFD-test-apparatus) 6 4.7.3 Test Scenario 10 4.8 Relationship of test methods versus base standard requirements 10 .12 5 Test methods for electrical characteristics of cards with contacts. VCC contact. 5.1 12 5.1.1 General. 12 .12 5.1.2 Apparatus Procedure. 5.1.3 12 5.1.4 Test report. 13 5.2 13 I/0 contact 5.2.1 General. 13 5.2.2 Apparatus. 13 Procedure. 5.2.3 13 5.2.4 Test report. 14 CLK contact 5.3 14 5.3.1 14 General. 5.3.2 14 Apparatus 5.3.3 Procedure. 15 Test report. .15 5.3.4 RST contact. 5.4 15 5.4.1 General. 15 5.4.2 Apparatus. 16 5.4.3 16 Procedure. 5.4.4 Test report. 16 5.5 SPU (C6) contact 16 .17 Test methods for logical operations of cards with contacts 6 6.1 Answer to reset. 17 .17 6.1.1 Cold reset and answer-to-reset (ATR) 6.1.2 Warm reset. 17 6.2 T=0 Protocol 18 6.2.1 General. 18 6.2.2 I/O transmission timing for T=0 protocol 18 6.2.3 I/O character repetition for T=0 protocol. 19 I/O reception timing and error signalling for T=0 protocol 19 6.2.4 6.3 20 T=1 Protocol 6.3.1 20 General. 6.3.2 I/0 transmission timing for T=1 protocol 20 6.3.3 I/O reception timing for T=1 protocol. 21 iii @ IS0/IEC 2018 - All rights reserved