JEDEC STANDARD Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices JESD89B (Revision of JESD89A, October 2006) SEPTEMBER 2021 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION JEDEC Downloadedbyryanliu([email protected])onFeb12,2025,6:34pmPsT NOTICE JEDEC standards and publications contain material that has been prepared, reviewed, and approved through the JEDEC Board of Directors level and subsequently reviewed and approved by the JEDEC legal counsel. JEDEC standards and publications are designed to serve the public interest through eliminating misunderstandings between manufacturers and purchasers, facilitating interchangeability and improvement of products, and assisting the purchaser in selecting and obtaining with minimum delay the proper product for use by those other than JEDEC members, whether the standard is to be used either domestically or internationally. JEDEC standards and publications are adopted without regard to whether or not their adoption may involve patents or articles, materials, or processes. By such action JEDEC does not assume any liability to any patent owner, nor does it assume any obligation whatever to parties adopting the JEDEC standards or publications. The information included in JEDEC standards and publications represents a sound approach to product specification and application, principally from the solid state device manufacturer viewpoint. Within the JEDEC organization there are procedures whereby a JEDEC standard or publication may be further processed and ultimately become an ANSI standard. No claims to be in conformance with this standard may be made unless all requirements stated in the standard are met. Inquiries, comments, and suggestions relative to the content of this JEDEC standard or publication should be addressed to JEDEC at the address below, or refer to www.jedec.org under Standards and Documents for alternative contact information. Published by @JEDEC Solid State Technology Association 2021 3103 North 10th Street Suite 240 South Arlington, VA 22201-2108 JEDEC retains the copyright on this material. By downloading this file the individual agrees not to charge for or resell the resulting material. PRICE: Contact JEDEC Printed in the U.S.A. All rights reserved Downloadedbyryanliu([email protected])onFeb12,2025,6:34pmPsT PLEASE! DON'T VIOLATE THE LAW! This document is copyrighted by JEDEC and may not be reproduced without permission. For information, contact: JEDEC Solid State Technology Association 3103 North 10th Street Suite 240 South Arlington, VA 22201-2107 or refer to www.jedec.org under Standards-Documents/Copyright Information. Downloaded by ryan liu ([email protected]) on Feb 12, 2025, 6:34 pm PST CCSC Downloaded by ryan liu ([email protected]) on Feb 12, 2025, 6:34 pm PST JEDEC Standard No. 89B RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES CONTENTS Page Foreword Introduction. .ili 1 Scope 2 Terms and definitions 3 Test equipment and software requirements 3.1 Test plan... 3.2 Test equipment... 3.3 Test conditions. 12 3.4 Considerations for Soft Error Testing of Individual Circuit Elements 3.5 Considerations for IC Testing .. 4 Real-time (unaccelerated and high-altitude) soft error test procedures 4.1 Background... 21 4.2 Test facilities and equipment . 4.3 Testing procedures . 4.4 Differences in real-time soft error tests and actual end-user observed fail rates 26 5 Accelerated alpha particle test procedure 27 5.2 Alpha particle environment. 5.3 Packaging for alpha particle testing .... 5.4 Alpha particle sources.. 29 5.5 Test procedure and results. 32 5.6 Interferences... 35 6 Accelerated high-energy neutron test procedures .36 6.1 Background. 36 6.2 Test facilities. 6.3 Angular Dependence Considerations. 6.4 Beam parameters.... 37 6.5 Fundamental quantities: soft error cross-section and soft error rate 39 6.6 Interferences - Scattering, secondary ion effects and thermal neutrons at the DUT 48 -i- Downloaded by ryan