JEDEC STANDARD Mechanical Compressive Static Stress Test Method JESD22-B119 OCTOBER 2018 JEDEC SOLID STATE TECHNOLOGY ASSOCIATION JEDEC Downloadedbywangxue (
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[email protected]) on Jul 12, 2020, 10:12 pm PDT JEDEC Standard No. 22-B119 Page 1 MECHANICAL COMPRESSIVE STATIC STRESS TEST METHOD (From JEDEC Board Ballot, JCB-18-27, formulated under the cognizance of the JC-14.1 Subcommittee on Reliability Test Methods for Packaged Devices.) 1 Scope Devices of large size with high power consumption are fairly common. A heat sink may be used to dissipate heat from devices with high power consumption or those outputting a large amount of thermal energy. Such devices may endure high mechanical compressive stress from the heat sink resulting in failure; for example, issue like die crack could lead directly to electrical malfunction. As Figure 1, heat sink is used for the device of FC-BGA package with lid. Heat sink may be used for other packages, like package with stiffener, sometimes even for lidless or bare die. Heat-sink PCB PCBTray TIM2 TIM1 Device TIM1: Thermal interface material between die and lid for FC-BGA TIM2: Thermal interface material between devices and heat sink Figure 1 - IC device package and its heat sink on board Mechanical compressive strength is an inherent property of the device. Mechanical over stress and excessive localized loading may cause device failures. Permanent changes in electrical and/or physical characteristics c