IEC IEC 63616 Edition 1.0 2025-11 INTERNATIONAL STANDARD NORME INTERNATIONALE Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method Mesurage de la conductivite des films minces metalliques aux hyperfrequences et aux frequences a ondes millimetriques -Methode du resonateura disque circulairedetypesymetrique IEC 63616:2025-11(en-fr) ICS 17.220.20, 29.050 ISBN 978-2-8327-0894-1 THISPUBLICATIONIS COPYRIGHT PROTECTED Copyright@2025IEC,Geneva,Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanicai, including photocopying and microfilm, without permission in writing from either IEc or IEC's member National Committee in the country of the requester. If you have any questions about IEc copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. les microfilms, sans I'accord écrit de I'lEC ou du Comite national de I'lEC du pays du demandeur. Si vous avez des questions sur le copyright de I'lEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnées ci-apres ou contactez le Comite national de I'lEC de votre pays de residence. IEC Secretariat Tel.: +41 22 919 02 11 3, rue de Varembe
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