IEC IEEE IEC 62526 Edition 1.02007-11 INTERNATIONAL IEEE1450.1TM STANDARD Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor DesignEnvironments IEEE Std. 1450.1-2005 IEC 62526:2007(E) lional Electrotechnical Commission without ficense from IHS THISPUBLICATIONIS SCOPYRIGHTPROTECTED Copyright@2007IEEE All rights reserved. IEEE is a registered trademark in the U.S. Patent & Trademark Office, owned by the Institute of Electrical and Electronics Engineers, Inc. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means. electronic or mechanical, including photocopying and microfilm, without permission in writing from the IEC Central Office. Any questions about IEEE copyright should be addressed to the IEEE. Enquiries about obtaining additional rights Committee IEC Central Office The Institute of Electrical and Electronics Engineers, Inc 3, rue de Varembe 3 Park Avenue CH-1211 Geneva 20 US-New York, NY10016-5997 Switzerland USA Email: [email protected] Email: [email protected] Web: www.iec.ch Web: www.ieee.org About the IEC International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEc on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical commitee,..). It also gives information on projects, withdrawn and replaced publications. -IEC JustPublished:www.iec.ch/online_news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. - Electropedia: www.electropedia.org The world's leading online dictionary of electronic and electrical terms containing more than 20 ooo terms and definitions in English and French, with equivalent terms in additional languages. Also known as the International Electrotechnical Vocabulary online. :CustomerServiceCentre:www.iec.ch/webstore/custserv Centre FAQ or contact us: Email: [email protected] Tel.: +41 22 919 02 11 Fax: +41 22 919 03 00 Copyright Intemational Electrotechnical Commission User=Japan, IHS d without license from IHS IEC IEEE IEC 62526 Edition 1.02007-11 INTERNATIONAL IEEE 1450.1TM STANDARD Standard for Extensions to Standard Test Interface Language (sTIL) for SemiconductorDesignEnvironments INTERNATIONAL ELECTROTECHNICAL COMMISSION PRICE CODE XF ICS 25.040 ISBN 2-8318-9348-8 Copyright Intemational Electrotechnical Commission Not foreRes lon without license from IHS IEC 62526:2007(E) -2- IEEE 1450.1-2005(E) CONTENTS FOREWORD IEEE Introduction 1. 1.1 Scope. 10 1.2 Purpose. 11 2. Definitions, acronyms, and abbreviations... 11 2.1 Definitions 2.2 Acronyms and abbreviations. 3. Structure of this standard 12 STIL syntax description 4. 4.1 Reserved words. .13 4.2 Reserved characters 14 4.3 Reserved UserFunctions .15 4.4 Signal and group name characteristics.. 15 4.5 STIL name spaces and name resolution ..16 5. Expressions 5.1 Constant and variable expressions.... 5.2 Expression delimiters—single quotes and parentheses 17 5.3 Arithmetic expressions—integer, real, time, boolean.. 19 5.4Pattern data expressions...... 20 5.5 Expression processing.. 21 5.6 Boolean—boolean_expr 26 5.7 Integers—integer_expr. 26 5.8 Logic expressions—logic_expr . 27 5.9 Real expressions—real_expr. 28 5.10 Addition to timing expressions—time_expr... 29 5.11 SignalVariables—sigvar_expr... 30 5.12 Formal parameters in procedures and macros .... .32 5.13 Integer lists—integer_list... 32 6. Statement structure and organization of STIL information.. .33 7. STIL statement... 33 7.1 STIL syntax. 34 7.2 STILexample. 34 8. UserKeywords statement 34 8.1 UserKeywords syntax 34 8.2 UserKeywords example 34 e with IE ees/111111100