LEC IEC60689 Edition2.02008-11 INTERNATIONAL STANDARD Measurement and test methods for tuning fork quartz crystal units in the range from10kHzto200kHzandstandardvalues IEC 60689:2008(E) THISPUBLICATIONISCOPYRIGHTPROTECTED Copyright@2008IEC,Geneva,Switzerland either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, IEC Central Office 3, rue de Varembe CH-1211 Geneva 20 Switzerland Email: [email protected] Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEc on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee...). It also gives information on projects, withdrawn and replaced publications. : IEC Just Published: www.iec.ch/online news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. . Electropedia: www.electropedia.org The world's leading online dictionary of electronic and electrical terms containing more than 20 o00 terms and definitions Vocabulary online. -Customer Service Centre:www.iec.ch/webstore/custserv Centre FAQ or contact us: Email: [email protected] Tel.: +4122919 0211 Fax: +4122 919 03 00 EC IEC 60689 Edition 2.02008-11 INTERNATIONAL STANDARD from10kHzto200kHzandstandardvalues INTERNATIONAL ELECTROTECHNICAL COMMISSION R PRICECODE ICS 31.140 ISBN 2-8318-1018-6 ?Register ICommission 60689 IEC:2008(E) 2 CONTENTS FOREWORD. 1 Scope.. 2 Normative references 6 3 Overview 3.1 General.. 3.2 Applied frequency range.. 3.3 Measurement method. 3.4 Load capacitance 3.5 Recommendeddrive level. 3.6 Measurement conditions. 3.7 Measurement of frequency-temperature characteristics 3.8 Loadcapacitancefrequencycharacteristics 4 Measurement methods .. 4.1 Method A.. 4.1.1 Vector network analyzer/vectorimpedance analyzer. 4.1.2 Block diagram...... 4.1.3 Specifications for vector network analyzer/vector impedance analyzer .....8 4.1.4 Test fixture .... .8 4.1.5 Measurement of equivalent circuit constants 9 4.1.6 Frequency pulling. 4.2 Method B. 10 4.2.1 General 4.2.2 Block diagram. 4.2.3 Calibration. 4.2.4 Procedure.. 12 5 Measurement conditions. 12 General. 5.1 5.2 Measurement conditions... .12 5.3 Measurement of the frequency-temperature dependence 13 5.3.1 General ..... 5.3.2 Block diagram. .13 5.3.3 Determination of the turnover point and parabolic coefficient β (standardreferencemethod) 14 5.3.4 Measurement of thefrequency versus temperaturecharacteristics (massproductionmethod) 14 5.3.5 Frequency C, curve... Test and environmental examination.. 6 .15 6.1 Application of the definition of IEC 60122-1 6.2 Magnetism -Influence of a magnetic field on the frequency. 6.3 Enclosure. .16 6.4 Measuring conditions and electric performance 16 6.4.1 General 16 6.4.2 Measurement conditions, 6.4.3 Standard values 16 Bibliography.... 18 60689@IEC:2008(E) -3- Figure 1-Block diagram of the measurement method using the vector network analyzerorvector impedanceanalyzer .8 Figure 2-Block diagram of test fixture. .9 Figure 3-Block diagram of test fixture (including a load capacitance). Figure 4-Block diagram of test fixture for bridge method 11 Figure 5 -Block diagram of test fixture for bridge method (including a load capacitance)... 11 Figure 6 -Block diagram of measurement of the frequency-temperature dependence .. Figure7-Frequency-temperaturetemplate (Turnover point:25±5°C,β=-45×10_g/°C2) 14 Figure8a)-Afif versus CLcurv