IEC IEC TS 62132-9 Edition 1.02014-08 BB TECHNICAL SPECIFICATION SPECIFICATION TECHNIQUE colour nside Integrated circuits-Measurement of electromagnetic immunity Part 9: Measurement of radiated immunity - Surface scan method Circuits integres -Mesure de I'immunite électromagnetique- Partie 9: Mesure de I'immunite rayonnee-Methode de balayage en surface IEC TS 62132-9:2014-08(en-fr) Copyrighted i I material l THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright @ 2014 IEC, Geneva, Switzerland either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enguiry about obtaining additional rights to this publication, piease contact the address below or your local IEC member National Committee for further information. Droits de reproduction reserves. Sauf indication contraire, aucune partie de cette publication ne peut étre reproduite ni utilisée sous quelque forme que ce soit et par aucun procede, électronique ou mecanique, y compris la photocopie et les microfilms, sans I'accord écrit de I'IEc ou du Comite national de I'IEC du pays du demandeur. Si vous avez des Reuters ( questions sur le copyright de I'iEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnees ci-apres ou contactez le Comite national de Il'lEC de votre pays de résidence. (Scientific), Inc., IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varembé Fax: +41 22 919 03 00 CH-1211 Geneva 20
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