bsi. ...making excellence a habit Inspiring trust foramore resilient world 需要更多标准请联系 wechat: wpwyq310 BS IEC 62880-1:2017 BSI Standards Publication Semiconductor devices Stress migration test standard Part 1: Copper stress migration test standard 详询VX:wpwyq310 文字不会影响您的编辑 bsi. BRITISH STANDARD BSIEC62880-1:2017 National foreword ThisBritish Standard istheUK implementation ofIEC62880-1:2017. The UK participation in its preparation was entrusted to Technical CommitteeEPL/47, Semiconductors. A list oforganizationsrepresented on this committee can beobtained on request to its committee manager. This publication does not purport to include all the necessary provisions ofa contract.Users areresponsiblefor its correct application. @TheBritishStandards Institution2020 Published byBSIStandards Limited2020 ISBN9780580858086 ICS31.080.01 CompliancewithaBritish Standard cannot confer immunityfrom legal obligations. This British Standard was published under the authority of the Standards Policy and Strategy Committee on31 July 2020. Amendments/corrigenda issued sincepublication Date Text affected 详询VX:wpwyq310 文字不会影响您的编辑