IEC IEC62047-30 Edition 1.02017-09 INTERNATIONAL STANDARD colour inside Semiconductordevices-Micro-electromechanicaldevices- Part30:Measurementmethodsofelectro-mechanicalconversion characteristics ofMEMSpiezoelectricthinfilm IEC 62047-30:2017-09(en) Copyright Interm out ficense from IHS THIS PUBLICATION IS COPYRIGHTPROTECTED Copyright2017IEC,Geneva,Switzerland or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. IEC Central Office Tel.: +41 22 919 02 11 3,rue de Varembe Fax: +4122919 0300 CH-1211 Geneva 20
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[email protected] Copyright Intermational Electrotechnical Commission /5926867100, User=JACKEY, MA JEC IEC 62047-30 Edition 1.02017-09 INTERNATIONAL STANDARD colour inside Semiconductordevices-Micro-electromechanicaldevices- Part 3o:Measurement methods ofelectro-mechanical conversion characteristics of MEMS piezoelectric thin film INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 31.080.99; 31.140 ISBN 978-2-8322-4820-1 Warning!Make sure that you obtained this publication froman authorized distributor. ?Regi Copyright International Elect apun n se with IEC ense from IHS