LEC IEC62047-17 Edition1.0 2015-03 INTERNATIONAL STANDARD NORME INTERNATIONALE colour nside Semiconductor devices-Micro-electromechanicaldevices Part 17: Bulge test method for measuring mechanical properties of thin films Dispositifsasemiconducteurs-Dispositifsmicroelectromecaniques Partie17:Methoded'essaiderenflementpourlamesuredesproprietes mecaniquesdescouchesminces IEC 62047-17:2015-03(en-fr THISPUBLICATIONIS COPYRIGHTPROTECTED Copyright2015IEC,Geneva,Switzerland or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, please contact the address below or your local IEC member National Committee for further information. Droits de reproduction reserves. Sauf indication contraire, aucune partie de cette publication ne peut etre reproduite et les microfilms, sans I'accord ecrit de IIEC ou du Comite national de IIEC du pays du demandeur. Si vous avez des questions sur le copyright de I'lEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnees ci-apres ou contactez le Comite national de 'lEC de votre pays de residence. IEC Central Office Tel.: +41 22 919 02 11 3, rue de Varembe Fax: +41 22 919 03 00 CH-1211Geneva20
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