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IEC IECTR62453-51-90 Edition 1.0 2017-06 TECHNICAL REPORT colour nside Field device tool (FDT) interface specification- Part 51-90: Communication implementation for common object model - IEC 61784CPF 9 INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 25.040.40; 35.110.05; 35.110 ISBN978-2-8322-4328-2 Warning! Make sure that you obtained this publication from an authorized distributor. ?Registeredtrade oftheInternationa IECTR62453-51-90:2017IEC2017 2- CONTENTS FOREWORD. INTRODUCTION. 1 Scope .6 2 Normative references .. .6 3 Terms,definitions,symbols,abbreviated terms and conventions 3.1 Terms and definitions. 6 3.2 Symbols and abbreviated terms 3.3 Conventions.... 3.3.1 Data type names and references to data types 3.3.2 Vocabularyfor requirements. Bus category ... 4 5 Access to instance and device data 6 Protocol specific usage of general datatypes Protocol specific common data types 7 .8 8 Network management data types 8 8.1 General... 8.2 HART device address. 9 Communication data types... .8 9.1 General..... 9.2 General communication-FDTHARTCommunicationSchema. 9.3 ConnectRequestfor'Extended_HART'protocols.. ..12 10 Channel parameter data types-FDTHARTChannelParameterSchema.. .13 Device identification. 11 ..15 11.1 Device type identification data types .15 11.1.1 Identification schemaforprotocol'HART'-FDTHARTldentSchema.... 11.1.2 Identificationschemafor'Extended_HART'protocols- FDTHART_ExtendedldentSchema... ...16 11.2 Topologyscandatatypes-DTMHARTDeviceSchema... ..16 11.3 Scan identification data types .. .18 11.3.1 General.... .18 11.3.2 Scan for protocol‘HART'-FDTHARTScanldentSchema 18 11.3.3 ScanforExtended_HART'protocols- FDTHARTExtendedScanldentSchema. ..19 11.4 Device type identification data types... ..21 11.4.1 General ..... 11.4.2 Identificationforprotocol'HART'-FDTHARTDeviceldentSchema... ..21 11.4.3 Identification for'Extended HART'protocols- FDTHART_ExtendedDeviceldentSchema... ....22 11.5 XSLT Transformation.... ...23 11.5.1 XSLTTransformationforprotocol'HART' ..23 11.5.2 Transformation for'Extended_HART'protocols... ..29 Bibliography.. .35 Figure1-Part51-90of theIEC62453series 5 Table 1- Protocol specific usage of general data types .8 3 - IECTR62453-51-90:2017?IEC2017 INTERNATIONALELECTROTECHNICALCOMMISSION FIELDDEVICETOOL(FDT)INTERFACESPECIFICATION- Part 51-9o:Communicationimplementationfor commonobject model- IEC61784CPF9 FOREWORD 1)The International Electrotechnical Commission (IEC)is a worldwide organization for standardization comprising all national electrotechnical committees (IEc National Committees). The object of IEC is to promote international co-c operation on all questions concerning standardization in the electrical and electronic fields.To this end and in addition to other activities, IEc publishes International Standards, Technical Specifications, Technical Reports,Publicly Available Specifications (PAS)and Guides (hereafter referred to as “IEC Publication(s)" ; any IECNational Committee interested in the subject dealt with may participate in this preparatory work.International, governmental and non- governmental organizations liaising with the IE also participate in this preparation.IEc collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2)Theformal decisions oragreementsof IEC on technicalmattersexpress,as nearlyaspossible,an international of opinion onthe relevant subjects sinceeachtechnical committeehas representation from all consensu interested IEC National Committees. 3) IEc Publications have the form of recommendations for international use and are accepted by IEc National Committees in that sense. While all reasonable efforts are made to ensure that thetechnical content of IEC Publicationsis accurate, IEc cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. transparently to the maximum extent possible in their nationa

.pdf文档 IEC 60749-43 2017 Semiconductor devices - Mechanical and climatic test methods - Part 43 Guidelines for IC reliability qualification plans

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