IEC ECTS 62607-6-8 Edition 1.02023-06 TECHNICAL SPECIFICATION colour nside Nanomanufacturing - Key control characteristics - Part 6-8: Graphene - Sheet resistance: In-line four-point probe IEC TS 62607-6-8:2023-06(en) IEC IEC TS 62607-6-8 Edition 1.0 2023-06 TECHNICAL SPECIFICATION colour inside Nanomanufacturing - Key control characteristics - Part 6-8: Graphene - Sheet resistance: In-line four-point probe INTERNATIONAL ELECTROTECHNICAL COMMISSION ICS 07.120 ISBN 978-2-8322-7113-1 Warning! Make sure that you obtained this publication from an authorized distributor. ?Registeredtradem k of the Int tional ElectrotechnicalCommission IEC TS 62607-6-8:2023 @ IEC 2023 CONTENTS FOREWORD INTRODUCTION. Scope. 7 2 Normative references . 3 Terms and definitions 3.1 General terms 3.5 Key control characteristics measured in accordance with this standard... 3.6 Terms related to the measurement method . 9 4 General 10 4.1 Measurement principle.... 4.2 Sample preparation method .. 11 4.3 Description of measurement apparatus . 11 4.4 Ambient conditions during measurement. 4.5 Related standards.. 12 5 Measurement procedure. 12 5.1 Calibration of measurement equipment. 5.2 Detailed protocol of the measurement procedure ... 12 5.3 Measurement accuracy ... 13 6 Data analysis and interpretation of results . 13 7 Results to be reported 7.1 Cover sheet ... 7.2 Product and sample identification 7.3 Measurement conditions ... 14 7.4 Measurement results.. 14 Annex A (informative) Effects of ambient conditions on graphene resistance measurements. 17 A.1 General. A.2 Temperature (T).... 17 A.3 Relative humidity (RH).... Annex B (normative) More specific cases B.1 Non-equidistant probes 18 B.2 Proximity to the edge ... B.3 Non-equidistant probes and proximity to the edge Annex C (informative) Experimental example. Sample ... C.1 C.2 Ambient conditions C.3 Instrumentation .. C.4 Sampling plan .. 19 C.5 Measurement procedure . C.6 Results .20 Annex D (informative) Other standards related to the measurement of sheet resistance 21 Bibliography 22 Figure 1 - Schematic representation of the four-point probe method (left) and detail of the structure of a spring-mounted probe (right) ... .11