IEC IEC63284 Edition 1.0 2022-04 INTERNATIONAL STANDARD NORME NTERNATIONALE Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors Dispositifs a semiconducteurs - Methode d'essai de fiabilité par la commutation sur charge inductive pour les transistors au nitrure de gallium IEC 63284:2022-04(en-fr) THIS PUBLICATION IS COPYRIGHT PROTECTED Copyright @ 2022 IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form orbyanymeans,electronicormechanical, including photocopyingand microfilm,without permission in writingfrom eitherIEC or IEC's member National Committee inthecountry of the requester.If you have any questions about IEC your local IEC member National Committee for further information. ni utilisée sous quelque forme que ce soit et par aucun procede, électronique ou mecanique, y compris la photocopie et les microfilms, sans I'accord écrit de I'IEc ou du Comite national de I'lEC du pays du demandeur. Si vous avez des questions sur le copyright de I'lEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez lescoordonnées ci-apres oucontactezleComiténational de l'lECdevotrepays derésidence. IEC Secretariat Tel.: +41 22 919 02 11 3, rue de Varembé
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