论文标题
仪表场涂抹对离散效应的影响
The influence of gauge field smearing on discretisation effects
论文作者
论文摘要
在设计晶格操作时，经常使用规格场涂抹来定义晶格狄拉克操作员。由于涂抹过程消除了紫外线波动的影响，因此，费米子有效地看到了比量规场更大的晶格间距。由矩形威尔逊循环的比率形成的CREUTZ比率是基于涂抹量规场的矩形Wilson Loop的比例，这是足够的可观察力，可以研究涂抹的效果，因为它们不需要重态化，并提供了对费米斯感受到的物理力的量度。我们研究了它们在各种涂抹半径（固定在晶格单元中）的行为，尤其是涂片如何影响朝着连续性极限的缩放。由于我们将Wilson梯度流作为涂抹，因此当流动时间固定在物理单位中时，相同的Creutz比率具有另一个定义明确的连续性极限。在有限的$ a $下进行较小的更正，达到了连续限制。
When designing lattice actions, gauge field smearing is frequently used to define the lattice Dirac operator. Since the smearing procedure removes effects of ultraviolet fluctuations, the fermions effectively see a larger lattice spacing than the gauge fields. Creutz ratios, formed from ratios of rectangular Wilson loops, based on smeared gauge fields are adequate observables to investigate the effect of smearing since they do not need renormalisation and provide a measure of the physical forces felt by the fermions. We study their behaviour at various smearing radii (fixed in lattice units) and in particular how the smearing influences the scaling towards the continuum limit. Since we employ the Wilson gradient flow as smearing, the same Creutz ratios have another, well defined continuum limit, when the flow time is fixed in physical units. That continuum limit is reached with smaller corrections at finite $a$.
